New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...
The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to ...
Back in the dawn of time, IC test was the last task in the design flow. First, you designed the chip and then you wrote the functional test program to verify it performed as expected after ...
As the demand for processing power for artificial intelligence (AI) applications grows, semiconductor companies are racing to develop AI-specific silicon. The AI market is incredibly dynamic, with ...
Die size and power estimations are at the foundation of SoC implementation. The key is how early and how accurately can it be done. These two parameters are the main data point for making some ...
Hierarchical DFT methodology and automotive functional safety have been two recent areas of focus for Mentor, a Siemens business. Legacy design-for-test flows impose inefficiencies when transitioning ...
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