Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...

The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.

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Across the physical world, many intricate structures form via symmetry breaking. When a system with inherent symmetry transitions into an ordered state, it can form stable imperfections known as ...

Please provide your email address to receive an email when new articles are posted on . Researchers found that VRVF results were in reasonable agreement with baseline SAP. VRVF exams had higher ...

QA teams now use machine learning to analyze past test data and code changes to predict which tests will fail before they run. The technology examines patterns from previous test runs, code commits, ...