EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...
EDN

Electroglas Intros Automated Defect Classification

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...
CIOL

Applied Materials next-gen defect review and classification tech

SANTA CLARA, USA: Applied Materials, Inc. announced a suite of new defect review and classification technologies for its market-leading SEMVision family of products to accelerate time to yield for ...
CIOL

SoftJin s/w for NxDAT mask defect analysis

SANTA CLARA, USA & BANGALORE, INDIA: SoftJin, a provider of customized automation software for electronic design and manufacturing, has announced the NxDAT, software for efficient analysis of defects ...
pv magazine International

Ensemble deep learning for PV cell defect detection

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Semiconductor Engineering

Improving Yield With Machine Learning

Machine learning is becoming increasingly valuable in semiconductor manufacturing, where it is being used to improve yield and throughput. This is especially important in process control, where data ...