Researchers from the University of Science and Technology of China (USTC) have unveiled a planar optical device that significantly enhances the capabilities of dark-field microscopy, achieving ...

Researchers have developed an atom-diffraction imaging method with micrometer spatial resolution, which may allow new applications in material characterization. Microscopy with atoms offers new ...

CHAMPAIGN, Ill. — A new imaging technique that uses electron diffraction waves to improve both image resolution and sensitivity to small structures has been developed by scientists at the University ...

Every lens has a sweet spot, the aperture where the image sharpness is at its best. If the aperture becomes larger, lens errors will become visible. When the aperture is closed, lens diffraction will ...

Researchers from the University of Science and Technology of China (USTC) led by Prof. ZHANG Douguo have unveiled a planar optical device that significantly enhances the capabilities of dark-field ...