A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...
In terms of resolution, SIMIP achieved a 1.5-fold improvement over conventional MIR photothermal imaging, with a full width at half-maximum (FWHM) of 335 nm versus 444 nm in standard methods. Moreover ...
Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...
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