NASHUA, NH – Flynn Systems Corporation announces the release of its USB Dual Channel 30MHz HighSpeed Test and Programming Cable for Boundary Scan applications. The HighSpeed Cable is the newest tool ...
Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...
The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
August 22, 2012. JTAG Technologies, a provider of solutions for testing and programming high-density PCBs, has announced a further extension to its line of high-performance boundary-scan IEEE Std.
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