Leica Geosystems, part of Hexagon, has introduced the Leica TerrainMapper-3 airborne lidar sensor. It features new scan pattern reconfigurability to support a variety of applications and requirements ...

With the increasing complexity in design in the semiconductor industry and advanced lower technology nodes, it is important as a DFT architecture design and service engineer to signoff the chip with ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

At 0.13 microns and below, IC manufacturers are starting to see more defects that are not caught by traditional stuck-at-fault testing. Defects like high impedance metal, high impedance shorts, and ...

Scan diagnostics play an important role in improving yield. As technologies move below 130 nm, the IC industry has seen a significant change in the type of defects encountered. Feature-related defects ...